Tiwald, T.E.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

DAI ZHEN'S DEFENSE OF SELF-INTEREST

Journal:

Journal of Chinese Philosophy

Year:

2011

Language:

english

File:

PDF, 1.57 MB

english, 2011

2

Xunzi on Moral Expertise

Journal:

Year:

2012

Language:

english

File:

PDF, 302 KB

english, 2012

3

DAI ZHEN ?? ON SYMPATHETIC CONCERN

Journal:

Journal of Chinese Philosophy

Year:

2010

Language:

english

File:

PDF, 1001 KB

english, 2010

4

Does ZhuXi Distinguish Prudence from Morality?

Journal:

Year:

2013

Language:

english

File:

PDF, 183 KB

english, 2013

5

Joy as a Moral Motive: A Response to Yong Huang's Why Be Moral?

Journal:

Philosophy East and West

Year:

2019

Language:

english

File:

PDF, 282 KB

english, 2019

6

A Right of Rebellion in theMengzi?

Journal:

Year:

2008

Language:

english

File:

PDF, 238 KB

english, 2008

7

Stephen C. Angle:Sagehood: The Contemporary Significance of Neo-Confucian Philosophy

Journal:

Year:

2011

Language:

english

File:

PDF, 127 KB

english, 2011

8

Sympathy and Perspective-Taking in Confucian Ethics

Journal:

Philosophy Compass

Year:

2011

Language:

english

File:

PDF, 1.55 MB

english, 2011

9

INTRODUCTION: A CONFUCIAN PHILOSOPHICAL AGENDA

Journal:

Journal of Chinese Philosophy

Year:

2011

Language:

english

File:

PDF, 221 KB

english, 2011

10

Assumed Transmission in Political Science: A Call for Bringing Description Back In

Althaus, Scott L., Swigger, Nathaniel, Chernykh, Svitlana, Hendry, David J., Wals, Sergio C., Tiwald, Christopher

Journal:

Journal of Politics

Year:

2011

Language:

english

File:

PDF, 299 KB

english, 2011

11

10.2307/23015362

Journal:

Philosophy East and West

Year:

2011

Language:

english

File:

PDF, 462 KB

english, 2011

12

Reply to Stephen Angle

Journal:

Year:

2011

Language:

english

File:

PDF, 85 KB

english, 2011

13

Fundamental studies on large area Cu(In,Ga)Se2 films for high efficiency solar cells

A.M Hermann, C Gonzalez, P.A Ramakrishnan, D Balzar, N Popa, P Rice, C.H Marshall, J.N Hilfiker, T Tiwald, P.J Sebastian, M.E Calixto, R.N Bhattacharya

Journal:

Solar Energy Materials and Solar Cells

Year:

2001

Language:

english

File:

PDF, 648 KB

english, 2001

14

Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry

Tiwald, Thomas E., Woollam, John A., Zollner, Stefan, Christiansen, Jim, Gregory, R. B., Wetteroth, T., Wilson, S. R., Powell, Adrian R.

Journal:

Physical Review B

Year:

1999

Language:

english

File:

PDF, 581 KB

english, 1999

15

Micelle-assisted bilayer formation of cetyltrimethylammonium bromide thin films studied with combinatorial spectroscopic ellipsometry and quartz crystal microbalance techniques

K.B. Rodenhausen, M. Guericke, A. Sarkar, T. Hofmann, N. Ianno, M. Schubert, T.E. Tiwald, M. Solinsky, M. Wagner

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 447 KB

english, 2011

16

In-situ monitoring of alkanethiol self-assembled monolayer chemisorption with combined spectroscopic ellipsometry and quartz crystal microbalance techniques

K.B. Rodenhausen, B.A. Duensing, T. Kasputis, A.K. Pannier, T. Hofmann, M. Schubert, T.E. Tiwald, M. Solinsky, M. Wagner

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 535 KB

english, 2011

17

Characterization of UV irradiated space application polymers by spectroscopic ellipsometry

Corey L. Bungay, Thomas E. Tiwald, Michael J. Devries, Brad J. Dworak, John A. Woollam

Journal:

Polymer Engineering & Science

Year:

2000

Language:

english

File:

PDF, 685 KB

english, 2000

18

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

James N. Hilfiker, Neha Singh, Tom Tiwald, Diana Convey, Steven M. Smith, Jeffrey H. Baker, Harland G. Tompkins

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1.35 MB

english, 2008

19

Infrared spectroscopic ellipsometry study of molecular orientation induced anisotropy in polymer substrates

Corey Bungay, Thomas E. Tiwald

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 269 KB

english, 2004

20

VUV and IR spectroellipsometric studies of polymer surfaces

John A. Woollam, Corey Bungay, James Hilfiker, Tom Tiwald

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2003

Language:

english

File:

PDF, 138 KB

english, 2003

21

Toward perfect antireflection coatings. 3. Experimental results obtained with the use of Reststrahlen materials

Dobrowolski, J. A., Guo, Yanen, Tiwald, Tom, Ma, Penghui, Poitras, Daniel

Journal:

Year:

2006

Language:

english

File:

PDF, 957 KB

english, 2006

22

Dielectric function of zinc oxide thin films in a broad spectral range

Mammadov, E., Naghavi, N., Jehl, Z., Renou, G., Tiwald, T., Mamedov, N., Lincot, D., Guillemoles, J.-F.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 542 KB

english, 2014

23

Measuring the thickness of organic/polymer/biological films on glass substrates using spectroscopic ellipsometry

H. G. Tompkins, T. Tiwald, C. Bungay, A. E. Hooper

Year:

2006

Language:

english

File:

PDF, 356 KB

english, 2006

24

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared

N. Hilfiker, James, Bungay, Corey L, Synowicki, Ron A., Tiwald, Thomas E., Herzinger, Craig M., Johs, Blaine, Pribil, Greg K., Woollam, John A.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2003

Language:

english

File:

PDF, 412 KB

english, 2003

25

Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example

Schubert, M., Rheinländer, B., Franke, E., Neumann, H., Tiwald, T. E., Woollam, J. A., Hahn, J., Richter, F.

Journal:

Physical Review B

Year:

1997

Language:

english

File:

PDF, 205 KB

english, 1997

26

Interface states in modulation-doped In/sub 0.52/Al/sub 0.48/As/In/sub 0.53/Ga/sub 0.47/As heterostructures

Hong, W.-P., Oh, J.-E., Bhattacharya, P.K., Tiwald, T.E.

Journal:

IEEE Transactions on Electron Devices

Year:

1988

Language:

english

File:

PDF, 614 KB

english, 1988

27

Uplifting Manhood to Wonderful Heights? News Coverage of the Human Costs of Military Conflict From World War I to Gulf War Two

Althaus, Scott L., Swigger, Nathaniel, Chernykh, Svitlana, Hendry, David J., Wals, Sergio C., Tiwald, Christopher

Journal:

Political Communication

Year:

2014

Language:

english

File:

PDF, 365 KB

english, 2014

28

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

Hilfiker, James N., Stadermann, Michael, Sun, Jianing, Tiwald, Tom, Hale, Jeffrey S., Miller, Philip E., Aracne-Ruddle, Chantel

Journal:

Applied Surface Science

Year:

2016

Language:

english

File:

PDF, 1.88 MB

english, 2016

29

Joy as a Moral Motive: A Response to Yong Huang's Why Be Moral?

Journal:

Philosophy East and West

Year:

2019

File:

PDF, 282 KB

2019

30

Application of a B-spline model dielectric function to infrared spectroscopic ellipsometry data analysis

Mohrmann, Joel, Tiwald, Thomas E., Hale, Jeffrey S., Hilfiker, James N., Martin, Andrew C.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2020

File:

PDF, 2.71 MB

2020

31

The Origin of the Berreman Effect in SiC Homostructures

St. Zollner, J. P. Carrejo, T. E. Tiwald, J. A. Woollam

Journal:

physica status solidi (b)

Year:

1998

Language:

english

File:

PDF, 131 KB

english, 1998

32

Dielectric Function of Polycrystalline SiC from 190 nm to 15 μm

S. Zollner, Ran Liu, A. Konkar, J. Gutt, S. R. Wilson, T. I. Tiwald, J. A. Woollam, J. N. Hilfiker

Journal:

physica status solidi (b)

Year:

1999

Language:

english

File:

PDF, 179 KB

english, 1999

33

Materials Characterization in the Vacuum Ultraviolet with Variable Angle Spectroscopic Ellipsometry

T. Wagner, J.N. Hilfiker, T.E. Tiwald, C.L. Bungay, S. Zollner

Journal:

physica status solidi (a)

Year:

2001

Language:

english

File:

PDF, 421 KB

english, 2001

34

Atomic scattering potentials for an aluminum surface: Test of ab initio calculations

P. Tiwald, C. Lemell, A. Schüller, H. Winter, J. Burgdörfer

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2011

Language:

english

File:

PDF, 632 KB

english, 2011

35

Repeatability of ellipsometric data in cholera toxin GM1–ELISA structures

Leon G. Castro, Daniel W. Thompson, Thomas Tiwald, Emil M. Berberov, John A. Woollam

Journal:

Surface Science

Year:

2007

Language:

english

File:

PDF, 376 KB

english, 2007

36

Numerical ellipsometry: Analysis of thin metal layers using n–k plane methods with multiple incidence angles

F.K. Urban III, D. Barton, T. Tiwald

Journal:

Thin Solid Films

Year:

2009

Language:

english

File:

PDF, 788 KB

english, 2009

37

Growth and characterization of large area Cu(In,Ga)Se2 films

A.M Hermann, C Gonzalez, P.A Ramakrishnan, D Balzar, C.H Marshall, J.N Hilfiker, T Tiwald

Journal:

Thin Solid Films

Year:

2001

Language:

english

File:

PDF, 311 KB

english, 2001

38

Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry

H. Arwin, L. M. Karlsson, A. Kozarcanin, D. W. Thompson, T. Tiwald, J. A. Woollam

Journal:

physica status solidi (a)

Year:

2005

Language:

english

File:

PDF, 150 KB

english, 2005

39

Vacuum ultraviolet optical analysis of spin-cast chitosan films modified by succinic anhydride and glycidyl phenyl ether

W. H. Nosal, D. W. Thompson, T. E. Tiwald, S. Sarkar, A. Subramanian, J. A. Woollam

Journal:

Surface and Interface Analysis

Year:

2007

Language:

english

File:

PDF, 237 KB

english, 2007

40

First documented case of human granulocytic ehrlichiosis in Austria

Gernot Walder, Barbara Falkensammer, Johannes Aigner, Gerhard Tiwald, Manfred P. Dierich, Reinhard Würzner, Peter Lechleitner

Journal:

Wiener klinische Wochenschrift

Year:

2003

Language:

english

File:

PDF, 298 KB

english, 2003

41

Höchste Versorgunssicherheit durch modernste Anlagenkonzepte

A. Sillaber, R. Tiwald, P. Walder, R. Tursky

Journal:

e & i Elektrotechnik und Informationstechnik

Year:

2005

Language:

german

File:

PDF, 1.46 MB

german, 2005

42

Fünfzehntelanhebung – Tod des Geschäftsraummieters

Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2007

Language:

german

File:

PDF, 41 KB

german, 2007

43

Rekurs – Zweiseitigkeit, Frist

Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2007

Language:

german

File:

PDF, 50 KB

german, 2007

44

Zur Abweichung des Begehrens um gerichtliche Entscheidung vom Gegenstand des Antrages an die Schlichtungsstelle

Riss, Maria Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2007

Language:

german

File:

PDF, 56 KB

german, 2007

45

Unternehmensveräußerung – Unternehmensidentität

Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2007

Language:

german

File:

PDF, 46 KB

german, 2007

46

Verbotene Ablöse – zeitweise Hauptmietzinserhöhung

Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2007

Language:

german

File:

PDF, 51 KB

german, 2007

47

Sofortige Auflösung eines gemischten Dauerschuldverhältnisses (Miete, Büroorganisation und Personalbereitstellung)

Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2008

Language:

german

File:

PDF, 56 KB

german, 2008

48

Mietzinsminderung bei eingeschränkter Liftnutzungsmöglichkeit

Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2008

Language:

german

File:

PDF, 46 KB

german, 2008

49

Kommanditgesellschaft – Mietzinsanhebung, Anzeige

Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2008

Language:

german

File:

PDF, 52 KB

german, 2008

50

Wohnungsgebrauchsrecht – Verjährung

Wittmann-Tiwald

Journal:

Wohnrechtliche Blätter

Year:

2007

Language:

german

File:

PDF, 54 KB

german, 2007